D.18TEM cell -
Frequency range: 0.8 GHz to 3.0 GHz
-
VSWR over frequency range: < 1.50
-
Input impedance: 50 Ω
-
Septum height in test region: 2 times to 3 times maximum dimension of hearing aid
-
Field uniformity in test region: 0 dB to 6 dB
D.19True rms voltmeter -
Input impedance: ≥ 100k Ω
-
Frequency range: 10 Hz to > 10 kHz
-
Averaging time: 0.1 sec and 3 sec
-
Input sensitivity: 0.7 mV or better
-
Accuracy: ± 3%
Annex E
(informative)
Sample measurement uncertainty estimates
Measurement uncertainty reflects the quality and accuracy of a measured result as compared to the true value. Such statements are generally required when stating results of measurements so that it is clear to the user of these measurement results that the results may differ when reproduced by different laboratories. Measurement results vary due to the measurement uncertainty of the instrumentation, and measurement technique, even when using this standard for test setups and compliance measurements.
Most uncertainties are calculated using the tolerances of the instrumentation used in the measurement, the measurement setup variability, and the technique used in performing the test. While not generally included, the variability of the equipment under test also figures into the overall measurement uncertainty.
Another component of the overall uncertainty is based on the variability of repeated measurements (so-called type A uncertainty). This may mean that the hearing aid immunity tests may have to be repeated by taking down the test setup and resetting it up so that there is a statistically significant number of repeat measurements to identify this very important aspect of measurement uncertainty. By combining the repeat measurement results with that of the instrumentation chain using the technique contained in NIS 81 and NIS 3003,1 the overall measurement uncertainty can be estimated.
This annex contains sample calculations and typical values for the tests contained in this standard.
This clause gives a sample uncertainty estimation for the WD near-field emission measurement.
E.1.1Primary uncertainty factors
The following are judged to be the primary contributors affecting measurement uncertainty for this test:
Contributor Influence quantity Type Source of information
RF reflections ± 0.8 dB Specification 4.2.1 (reflections < –20 dB)
Field probe conversion factor ± 1.76 dB Specification C.3
Field probe anisotropy ± 0.5 dB Specification Typical probe manufacturer data
Positioning accuracy ± 1.62 dB Specification E.2.3.1.3
Probe cable placement ± 1 dB Specification D.10 and D.11
System repeatability ± 2 dB Specification System repeatability is established by performing a series of measurements under equal conditions. For further guidance, consult UKAS M3003.
Repeatability of the WD ± 0.5 dB Std. Dev. Estimate informal
E.1.2Sample estimation
Table E.14—Near-field measurement uncertainty
WD near-field measurement uncertainty estimation
|
Contribution
|
Data
dB
|
Data
type
|
Prob.
dist.
|
Weight
|
Uncertainty
dB
|
Notes/comments
|
RF reflections
|
0.8
|
Spec
|
Rect
|
1/√3
|
0.46
|
Reflections < –20 dB
|
Field probe conv. factor
|
1.76
|
Spec
|
Rect
|
1/√3
|
1.02
|
|
Field probe anisotropy
|
0.5
|
Spec
|
Rect
|
1/√3
|
0.29
|
|
Positioning accuracy
|
1.62
|
Accy.
|
Rect
|
1/√3
|
0.94
|
|
Probe cable placement
|
1.0
|
Spec
|
Rect
|
1/√3
|
0.58
|
|
System repeatability
|
2.0
|
Spec
|
Rect
|
1/√3
|
1.15
|
|
EUT repeatability
|
0.5
|
Std. Dev.
|
Norm.
|
1
|
0.5
|
|
Combined standard
uncertainty, uc(y)
|
|
|
Norm.
|
1
|
2.03
|
|
Expanded uncertainty, U(y)
|
|
|
Norm.
|
k = 2
|
4.06
|
|
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